Flexibility & Speed for Residual Stress & Retained Austenite Analysis
Designed for ease of use, speed, flexibility, and portability, this compact system includes a diffractometer, control cabinet, and personal computer. The system’s ergonomic design and sample auto-distancing feature make it easy to set-up. The TEC 4000 system can operate with either one or two detectors and perform single, double, or multiple exposures for fast, accurate, flexible measurements. Measurement data is analyzed with TEC’s user-friendly, Windows-based Sara TEC™ software that is included with the system. This compact system can perform in the laboratory, on the shop floor, or in the field. For even more portability, the personal computer can be easily replaced with a laptop computer. TEC stress analyzers have been in continuous operation worldwide for over 30 years. The TEC 4000 X-ray Diffraction System combines TEC’s proven accurate technique with streamlined adaptability in an instrument capable of performing anywhere, anytime.